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A Comparative Study on Structure, Stability and Electronic Properties of Doped Silicon Clusters SinX (X = Sc, Ti; n = 1-10) Using Quantum Chemical Method

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dc.contributor.authorLe Nguyen Ngoc Lan
dc.contributor.authorPhan Dang Cam Tu
dc.contributor.authorVu Thi Ngan
dc.contributor.authorNguyen Tien Trung
dc.date.accessioned2026-05-24T16:42:59Z
dc.date.available2026-05-24T16:42:59Z
dc.date.issued2015-01-01
dc.description.abstractA Comparative Study on Structure, Stability and Electronic Properties of Doped Silicon Clusters SinX (X = Sc, Ti; n = 1-10) Using Quantum Chemical Method
dc.identifier.urihttps://rims.qnu.edu.vn/handle/123456789/1293
dc.subjectSilicon Clusters
dc.subjectSinX (Sc/Ti)
dc.subjectElectronic Properties
dc.titleA Comparative Study on Structure, Stability and Electronic Properties of Doped Silicon Clusters SinX (X = Sc, Ti; n = 1-10) Using Quantum Chemical Method
dc.typejournal article
dspace.entity.typePublication
oairecerif.author.affiliationTruong Dai hoc Quy Nhon
oairecerif.author.affiliationTruong Dai hoc Quy Nhon
oairecerif.author.affiliationTruong Dai hoc Quy Nhon
oairecerif.author.affiliationTruong Dai hoc Quy Nhon

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